Investigation of DOE model analyses for open atmosphere laser polishing of additively manufactured Ti-6Al-4V samples by using ANOVA


ERMERGEN T., TAYLAN F.

Optics and Laser Technology, cilt.168, 2024 (SCI-Expanded, Scopus) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 168
  • Basım Tarihi: 2024
  • Doi Numarası: 10.1016/j.optlastec.2023.109832
  • Dergi Adı: Optics and Laser Technology
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Anahtar Kelimeler: APS, Design Expert, DOE model, Laser polishing, MATLAB, MINITAB, Ti-6Al-4V
  • Isparta Uygulamalı Bilimler Üniversitesi Adresli: Evet

Özet

Additive manufacturing (AM) has gained a significant advancement in recent years. Since AM methods enable the manufacturing of geometry-free parts, they are now widely used in various industries. However, additively manufactured parts often require surface quality treatments to reduce the surface roughness and mitigate residual stresses on the surface. Laser polishing is a popular high-quality technology to increase surface quality of the metals. However, in literature, there isn't any distinguished model for laser polishing to support a prescribed procedure and predict the outcomes of the operation. In this study, DOE (design of experiment) models were created by using MINITAB, Design Expert, MATLAB and APS to analyze the prescribed models and compare the statistical analyses of the softwares via ANOVA analysis. During the analyses, influence of process parameters on the final surface roughness were also investigated. At the end of the study, it has concluded that statistical DOE model analysis software such as MINITAB and Design Expert provide a solid mathematical regression formula for future prediction with over 90% accuracy, while MATLAB fails to satisfy providing a mathematical formula. On the other hand, APS can derive a mathematical formula; however the formula derived by APS is more complex than the formulas provided by statistical DOE model analysis software.