Comparison of Voltage Scaling and Gate Sizing for Low Power Custom IC Design
The IASTED International Conference on Circuits and Systems, Kailua-Kona, HI, United States Of America, 18 - 20 August 2008, (Full Text)
- Publication Type: Conference Paper / Full Text
- City: Kailua-Kona, HI
- Country: United States Of America
- Isparta University of Applied Sciences Affiliated: No