EFFECTS OF THERMAL ANNEALING ON ELECTRICAL CHARACTERIZATION OF Ti/P-Si/Al SCHOTTKY STRUCTURES

ASIL UĞURLU H., ÇINAR DEMİR K., COŞKUN C.

TFD 30, İstanbul, Turkey, 02 September 2013, (Summary Text)

  • Publication Type: Conference Paper / Summary Text
  • City: İstanbul
  • Country: Turkey
  • Isparta University of Applied Sciences Affiliated: No