Evaluation of paper two sidedness with SEM/AFM microscopetechnique

ŞAHİN H. T.

Wood Research, vol.56, no.2, pp.203-212, 2011 (SCI-Expanded, Scopus) identifier

  • Publication Type: Article / Article
  • Volume: 56 Issue: 2
  • Publication Date: 2011
  • Journal Name: Wood Research
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.203-212
  • Keywords: Atomic force microscopy, Cellulose, Paper surface, Scan area, microtopography, Scanning electron microscopy, Two sidedness
  • Isparta University of Applied Sciences Affiliated: No

Abstract

The atomic force microscopy AFM and scanning electron microscopy SEM micrographs show non-uniformly distributed grainy particles with various shapes on the paper surface. However, AFM studies revealed the features of the paper surfaces are probably caused by different physical and chemical processes. The height feature and roughness parameters may be used to make automated measurements between images. AFM methods are likely to be useful for detecting topographical changes on surface structures as well as for the clarification of the surface dislocation phenomena such as; two sidedness.